TY - GEN
T1 - Technological solutions for the detection and warning of natural disasters caused by the "el Niño" Phenomenon
AU - Barrientos, Alfredo
AU - Pino, Erick
AU - Uribe, Carlos
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/8
Y1 - 2019/8
N2 - In Peru, there is a great need for reducing the impact of natural disasters caused by the El Niño Phenomenon (FEN, by its Spanish acronym), as it results in significant losses. Some may be both human and material. This hydro-climatic event, which lashed the country for the last time in 2017, evidenced a lack of technological solutions to neutralize the impact of this type of events. This is why, in this article, alternatives specific to information and communication technologies (ICT) are proposed for the detection and warning of this natural phenomenon, and thus reduce its negative effects.
AB - In Peru, there is a great need for reducing the impact of natural disasters caused by the El Niño Phenomenon (FEN, by its Spanish acronym), as it results in significant losses. Some may be both human and material. This hydro-climatic event, which lashed the country for the last time in 2017, evidenced a lack of technological solutions to neutralize the impact of this type of events. This is why, in this article, alternatives specific to information and communication technologies (ICT) are proposed for the detection and warning of this natural phenomenon, and thus reduce its negative effects.
KW - CT
KW - El Niño Southern Oscillation Phenomenon (ENSO)
KW - Prevention of natural disasters
KW - Technologies for natural disasters
UR - https://www.scopus.com/pages/publications/85073566031
U2 - 10.1109/INTERCON.2019.8853570
DO - 10.1109/INTERCON.2019.8853570
M3 - Contribución a la conferencia
AN - SCOPUS:85073566031
T3 - Proceedings of the 2019 IEEE 26th International Conference on Electronics, Electrical Engineering and Computing, INTERCON 2019
BT - Proceedings of the 2019 IEEE 26th International Conference on Electronics, Electrical Engineering and Computing, INTERCON 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 26th IEEE International Conference on Electronics, Electrical Engineering and Computing, INTERCON 2019
Y2 - 12 August 2019 through 14 August 2019
ER -